XploRA Nano

Tip Enhanced Raman Scattering (TERS) or Nano-Raman

TERS brings Raman spectroscopy into nanoscale resolution imaging. TERS is therefore a super-resolution chemical imaging technique. Better yet, it is a label-free super-resolution imaging technique.

TERS imaging is performed with an AFM-Raman spectrometer, a Scanning Probe Microscope (SPM) integrated with an optical micro-spectrometer. The scanning probe microscope provides the means for nanoscale imaging, the optical microscope provides the means to bring the light to a functionalized probe, and the spectrometer is the sensor analyzing the light output providing chemical specificity.

The key in TERS is a properly enhancing probe. HORIBA Scientific has developped TERS probes in collaboration with different partners.

tip-enhanced Raman (TERS) or nano-Raman - HORIBA

The functionalized probe acts as a 'plasmonic antenna' which enhances the local electromagnetic field, enhancing the Raman scattering at the very end of the probe. With enough enhancement, the local near-field Raman signal largely overwhelms the far-field signal and Raman signal with nanoscale resolution can be observed.

Why is TERS quickly becoming the next big thing in nano-spectroscopy?

Because other near field optical techniques like NSOM have always lacked the sensitivity to perform proper Raman detection, while the local enhancement obtained from TERS probes truly makes it a reality.

Today HORIBA brings TERS to another level: through several collaboration with academia and continuous internal development efforts, HORIBA is now not only able to guaranty TERS probe efficiency, but guaranties TERS imaging and resolution.

While probes are now commercially available, high throuhgput and long term stability are critical to perform TERS imaging reliably: Faster is better when trying to circumvent the many possible uncontrolled sources of drift that would affect resolution.

This is where HORIBA's integrated solutions excel. Check out the power of AFM-Raman and TERS


To learn more about this technology and how you can integrate all your needs into one powerful instrument, please fill out the contact form or call or email your local HORIBA Scientific representative.

  •    Raman excitation lines from blue (473 nm) to NIR (785 nm)
  •    High spectral resolution

Manufactured by HORIBA Scientific

  •    Fully automated operation, start 33 measuring within minutes, not hours!
  •    Compatible with red and NIR Raman excitation lines thanks to 1.3 µm AFM laser diode
  •    Top and side Raman-AFM optical coupling with high NA (up to 100X, 0.7NA)
  •    Co-localized AFM-Raman image with optimized illumination spot size from the top
  •    TERS-proven label free chemical nano-imaging from top/side
  •    Fast TERS mapping with SWIFTTM
  •    Integrated software platform
  •    HORIBA Scientific TERS tips (STMTERS and AFM-TERS)

TERS Probes

Reliable, efficient TERS probes for NanoRaman imaging

STM-TERS tips and AFM-TERS tips are available for the HORIBA NanoRaman platform.

The TERS probes allow all modes of TERS operation: Top, side and bottom optical access.

Made of bulk noble metal (STM tips) or with a multilayer coating on AFM tips, the TERS probes are delivered in a protective package to maximize shelf-life.

Today, Silver coated TERS tips, Gold coated AFM-TERS tips and Gold STM-TERS tips are available (the same STM tips can be glued on tuning forks for both Shear-force and Normal-force microcopies).

SEM image of the Ag coated OMNI TERS probes
Figure: SEM image of the Ag coated OMNI TERS probes.

Find out more about OMNI TERS probes

Proven TERS reliability and efficiency on TERS test sample.

The HORIBA TERS probes are guaranteed to produce Raman signal enhancement at 633/638 nm on a reliable test sample crafted to easily show this performance.

Guaranteed performance of 9 out of 10 probes to reach > 40 contrast (tip down (near-field Raman) versus tip up (far-field Raman)), leading to an enhancement factor EF up to 106 with the OMNI TERS probes.

More than the amplification of the signal, the real proof of TERS is the nano-resolution. The STM-TERS probes and AFM-TERS probes will perform a routine 15 nm resolution using our test sample and even below.

TERS mapping of a single carbon nanotube
Figure: TERS mapping of a single carbon nanotube showing an optical spatial resolution down to 8 nm confirmed from the section analysis of the intensity of the TERS bands.

For this purpose, HORIBA proposes a test sample of dispersed single-walled Carbon Nanotubes (CNTs) together with Graphene Oxide flakes (GO) with a distribution range allowing easy imaging.

GO, SWCNTs and fullerenes C60 co-deposited on gold.
Figure: GO, SWCNTs and fullerenes C60 co-deposited on gold. (a) Combined TERS map 4x4 µm, 128 pixels per line, 100ms per pixel. Individual maps showing the distribution of components, (b) graphene oxide, (c) fullerenes C60, (d) CNTs. All carbon species can be detected and resolved.

Reliable TERS probes for a “TERS proven” system!

Because HORIBA integrates key SPM technology from AIST-NT, and because we have performed extensive development and testing, we are confident our instrumentation offers the highest performance on the market and we are able to guarantee TERS imaging and spatial nano-resolution ; and we show it on field!

On the installation of the NanoRaman equipment, the nano-resolution is shown by our Service team and the user gets a first TERS training. A TERS procedure, explaining the step-by-step operation to obtain TERS imaging is also provided.

Because we know that experience is acquired over time, we propose additional on site Application TERS trainings and an “Advanced TERS training” session in our Raman center of excellence in France.


To learn more about this technology and how you can integrate all your needs into one powerful instrument, please contact us.

Tags: Raman, AFM, Nano, Atom, AFM Raman

PTI - Horiba

PT. HORIBA Indonesia

Ruko Jalur Sutera Jl. Jalur Sutera Blok 20 A No. 16-17 Tangerang, Banten 15144, Indonesia

Tel: +62 (21) 30448525
Fax: +62 (21) 30448521
Email: info-sci.id@horiba.com