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Flex-CLUE is the ideal flexible package to handle highperformance CL analysis, for a wide range of applications, within an affordable budget. Based on a dedicated fiber-optic interface, Flex- CLUE offers a compact and remote CL...

UVISEL 2: The ultimate solution to every challenge in thin-film measurement HORIBA Scientific has invented the new generation of scientific spectroscopic ellipsometer that delivers the highest level of performance for nano and micro layer characterization.

The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin film characterization and process studies.

The HORIBA Scientific GD-Profiler HR™ gives the optimum in terms of resolution and number of elements to solve analytical problems even in the most complex matrices.

Products: UVISEL Plus: 190-920 nm | NIR Option: 2100 nm Measure thin film thickness and optical constants. The reference ellipsometer for research and process development.

High Precision R&D Spectroscopic Ellipsometer The UVISEL ellipsometer range offers the best combination of modularity and performance for thin film characterizations. Based on phase modulation technology, the UVISEL ellipsometers delivers high accuracy and high resolution measurements with an excellent signal to noise ratio.

Cathodoluminescence Solutions for Electron Microscopy HCLUE, with its mirror-based couple, is the optimal CL package for academic research, combining the modularity of our spectrometers with the high sensitivity of our wide range of detectors. HCLUE is the perfect tool to analyze...

HORIBA Scientific proposes accessories to handle various samples and multiply the possible applications.

Ultra-Fast, Sensitive and High Resolution Depth Profiling technique The new Plasma Profiling TOFMS addresses the needs of materials scientists across a wide range of application areas. PP-TOFMS provides fast elemental depth distribution of almost any material.

A versatile spectroscopic ellipsometer covering a range from VUV to NIR The UVISEL 2 VUV is a new generation of phase modulation ellipsometer for VUV measurements. It is the only spectroscopic ellipsometer on the market designed to deliver the fastest thin film measurements over the largest wavelength range, from 147 to 2100 nm.

Auto SE: Designed for your thin film measurements, to deliver maximum efficiency with simplicity The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.

A modular spectroscopic ellipsometer for everyday thin film characterization. Smart SE: a Powerful and Cost Effective Spectroscopic Ellipsometer The Smart SE from HORIBA Scientific is a versatile spectroscopic ellipsometer for fast and accurate thin film measurements.

HORIBA Scientific’s in- situ, in-line and large area ellipsometers are designed for the control of processes in research and industry.From in-situ thin film monitoring to large area uniformity mapping and in-line characterization of flexible devices, we offer a large range of solutions for thin film quality control.

Powerful and Advanced DeltaPsi 2 Software HORIBA Scientific’s spectroscopic ellipsometers are driven by the powerful and advanced DeltaPsi 2 software, designed for accurate and flexible measurement and characterization of thin film structures.

A large array of options and accessories is available for HORIBA Scientific’s Spectroscopic Ellipsometers to enhance and expand instrument performance and versatility. The modular design of our spectroscopic ellipsometers allows the instrument to be easily upgraded during its lifetime to best suit changing application requirements.

PT. HORIBA Indonesia

Ruko Jalur Sutera Jl. Jalur Sutera Blok 20 A No. 16-17 Tangerang, Banten 15144, Indonesia

Tel: +62 (21) 30448525
Fax: +62 (21) 30448521
Email: info-sci.id@horiba.com