MESA-50K

In order to meet RoHS/ELV and to analyze hazardous elements, HORIBA has offered the X-ray Fluorescence Analyzer XGT-1000WR series. Since 2002, 1000 units have been used all over the world for these applications to meet the critical needs from our customers to analyze the sample without cutting it. In 2012, an intuitive MESA-50 X-ray Fluorescence Analyser was released. It became every popular in a very short amount of time, and in 2013 a new type of MESA-50 with a big sample chamber has been added to the MESA-50 series.  It is equipped with the sophisticated LN2-free detector.  As/Sb analysis function and Multilayer Film FPM are available as options.



 

Features

1. Speedy 

Silicon Drift Detector (SDD) drastically reduces measurement times, and provides increased sensitivity, for true high throughput analysis.

2. Small

The MESA-50K features a large sized chamber without compromising the minimum footprint. Can be simply connected to PC via USB. ​

3. Simple 

  •   ​​​   Reduce routine maintenance work (LN2 free operation)
  •      No need for vacuum pumps
  •      Intuitive simple measurement process for all material types ​

4. Smart 

  •      English / Japanese / Chinese user interfaces
  •      Excel® data management tool 

5. Safe 

No worry about X-ray leakage

 

Options & Consumables

 



Manufactured by HORIBA Scientific

Basic Items

 

Principle

Energy dispersive X-ray fluorescence spectrometry

Target application

RoHS, ELV, Halogen Free

Meas. Elements

13Al - 92U

Sample type

Solid, Liquid, Powder

X-ray generator

 

X-ray tube

Max 50kV, 0.2mA

X-ray irradiation size

1.2mm, 3mm, 7mm (Automatic switching)

X-ray primary filter

4 types (Automatic switching) 

Detector
 

Type

SDD (Silicon Drift Detector)

Signal processor

Digital pulse processor

Sample chamber

Atmosphere

Air

Sample observation

CCD camera

Chamber size

460 x 360 x 150 mm [W x D x H]

Utility

Operation

PC (Windows® 7)

Power supply

100-240V, 50/60Hz

Dimensions

 

590 x 590 x 400 mm [W x D x H]

Weight

 

60 kg

Software

Analysis Function

Multilayer Film FPM (Optional), Sb/As analysis (Optional)

Tags: HORIBA, XRF, RoHS, WEEE, ELV

sample
Instruments upgrade

PT. HORIBA Indonesia

Ruko Jalur Sutera Jl. Jalur Sutera Blok 20 A No. 16-17 Tangerang, Banten 15144, Indonesia

Tel: +62 (21) 30448525
Fax: +62 (21) 30448521
Email: info-sci.id@horiba.com