SEMICONDUCTORS

As a cost-effective and good-performance technology, organic electronics, such as OLED, OEL, TFT and OPV are having a profound influence on the information technology industry, in fact, on the entire economy and society. HORIBA Scientific provides excellent solutions for the study and characterization of organic electronic materials.

The following analytical and instrumental techniques are used in Semiconductors, please click on the squares for further information.

 

Alloy Composition, Bandgap

   

     

Bandgap, PLE / PL

 

           

Compound Alloys

           

Contamination

     

   

Crystallinity (Silicon)

       

   

Doping Effects

         

Ferroelectric Thin Films

             

Fluorescence Spectra of CdSe Nanoparticles

 

           

Hetero-Structures

           

 

High, Low k Materials

       

 

Analysis of Multilayer Structures on Silicon

   

   

 

ONO Film

             

Optical Properties

             

Oxidized Porous Silicon

             

Photoluminescence

           

 

Plasma Etch End Point

       

   

Process Chemicals e.g. Pure Water, H2SO4, H3PO4, HCl, HNO3, NH3, Photo-resist

     

 

   

Porous Silicon

             

Quality Control Materials for Wafer Manufacturing

       

     

Quantitative Analysis of BPSG on Silicon

   

   

   

Raw Materials for Trace Elements

     

       

SOI Film

           

Stress / Strain

         

 

Super Lattice Structure and Defect Investigations

         

 

Superconductor

         

 

Thickness (Monolayer, Multi-Layers, Native Oxide, Roughness, Interface)

       

   

Thin Film Transistors, MOSFET, OTFT

       

   

Uniformity over Film Area and Depth

             

Fast elemental depth profiling

             

Contacts (silicides)

             

 
AFM-RAMAN
AFM-RAMAN
Model: XploRA Nano Xem tiếp

Main application

  • TERS - chemical fingerprint at the nanoscale
  • Polymers, organic molecules, blend imaging
  • Grafting quality

Thiol Self Assembled Monolayer AFM (left) and Raman (right) mapping

ELLIPSOMETER
ELLIPSOMETER
Model: Auto SE Xem tiếp

Main application

  • Layer thickness, optical constants
  • Anisotropy, crystallinity
  • Alloy ratio
  • Energy gap
  • Photoresistance, polymers

Optical constants of Superyellow material

FLUORESCENCE SPECTROMETER
FLUORESCENCE SPECTROMETER
Model: Fluorolog®- 3 Xem tiếp

Main application

  • Optical properties of luminescence materials
  • Absolute quantum efficiency measurements
  • Colorimetric analysis
  • Lifetime analysis

Colorimetric analysis of light-emitting devices

PT. HORIBA Indonesia

Ruko Jalur Sutera Jl. Jalur Sutera Blok 20 A No. 16-17 Tangerang, Banten 15144, Indonesia

Tel: +62 (21) 30448525
Fax: +62 (21) 30448521
Email: info-sci.id@horiba.com