Widely used in semiconductor research and microelectronic industries, ellipsometers enable users to characterize thin film thickness, optical constants, bandgap, crystallinity, interface and more of multilayer structures on a large spectral range from DUV to NIR. Read More

Application Notes

  • SE-02:Optical Characterization of Organic Semiconductors by Spectroscopic Ellipsometry
  • SE-21:High k Dielectric with Nanoscale Thickness Studied by VUV spectroscopic Ellipsometry & FTIR-ATR
  • SE-13:Characterization of III-V Semiconductors using Phase Modulated Spectroscopic Ellipsometry
  • SE-01:Spectroscopic Ellipsometry of Compound Semiconductors: AlxGa1-xN / GaN Hetero-Structures
  • SE-16:Ferroelectric Thin Films Characterization by Spectroscopic Ellipsometry PbZr1-xTixO3 & BA1-xSrxTiO3

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