Spectroscopic ellipsometers are widely used to characterize thin film photovoltaics. Properties of interest are film thickness, refractive index, absorption, bandgap and silicon crystallinity. Read More

Application Notes

  • SE-33:Spectroscopic Ellipsometry for CIGS (CuIn1-x GaxSe2 ) thin films characterization
  • SE-31:Characterization of silicon nanoparticles (Si-nps) embedded in a silicon-nitride matrix by spectroscopic ellipsometry
  • SE-30:Optical characterization of ITO films prepared in different atmospheres using Spectroscopic Ellipsometry
  • SE-25:P3HT:PCBM Bulk Heterojunction Solar Cells Characterization by Spectroscopic Ellipsometry
  • SE-01:Thin Film Photovoltaics by Spectroscopic Ellipsometry
  • SE-20:Characterization of Photovoltaic Devices by Spectroscopic Ellipsometry

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