- Depth Profile of 10B implanted with a maximum concentration at 400 nm. (sample from University of Houston)
PP-TOFMS may be used for the leading silicon photovoltaics technology for measuring dopant profiles and detecting the presence of impurities. One-click semi-quantification may be obtained or accurate quantification with calibration curve.
- J. Pisonero, L. Lobo, N. Bordel, A. Tempez, A. Bensaoula, N. Badi, A. Sanz-Medel, “Quantitative depth profile analysis of boron implanted silicon by pulsed radiofrequency- Glow Discharge-Time of Flight Mass Spectrometry”, Solar Energy Materials and Solar Cells, 94, 1352-1357 (2010). DOI:10.1016/j.solmat.2010.04.002
CIGS
- L Van Puyvelde, J Lauwaert, A Tempez, W Devulder, S Nishiwaki, F Pianezzi, C Detavernier, A N Tiwari and H Vrielinck
Electronic defect study on low temperature processed Cu(In,Ga)Se2 thin-film solar cells and the influence of an Sb layer, J. Phys. D: Appl. Phys. 48, 175104 (2015). doi:10.1088/0022-3727/48/17/175104 - Rémi Aninat, Guillaume Zoppi, Agnès Tempez, Patrick Chapon, Neil S Beattie, Robert Miles, Ian Forbes Crystallographic Properties and Elemental Migration in two-stage prepared Cu(In1-xAlx)Se2 thin films for photovoltaic applications .Journal of Alloys and Compounds, 2013, 566. pp. 180-186. ISSN 0925-8388. DOI :10.1016/j.jallcom.2013.03.091
CdTe
Thin film CdTe photovoltaic devices and reference layers deposited on glass substrates by the atmospheric pressure metalorganic vapour deposition (AP-MOCVD) at CSER (UK) are characterized for their arsenic (As) dopant levels in CdTe films PP-TOFMS. Rapid, low vacuum : PP-TOFMS will be the adequate tool for controlling the large scale production of CdTe PV materials.
- Depth Profile of CdTe layer doped with As on CdS on glass (sample from CSER)
- G. Kartopu, A. Tempez, A. J. Clayton, V. Barrioz, S. J. C. Irvine, C. Olivero, P. Chapon, S. Legendre and J. Cooper, Chemical analysis of Cd1-xZnxS/CdTe solar cells by plasma profiling TOFMS, Materials Research innovations, 18, 2, 82-85 (2014). DOI 10.1179/1433075X14Y.0000000207
- Cristina Gonzalez-Gago, Jorge Pisonero, Nerea Bordel, Alfredo Sanz-Medel, Nicole J. Tibbetts, and Vincent S. Smentkowski
Radiofrequency pulsed glow discharge-ToFMS depth profiling of a CdTe solar cell: A comparative study versus time of flight secondary ion mass spectrometry, J. Vac. Sci. Technol. A, 2013, 31, 06F106 . DOI: 10.1116/1.4824164
