Spectroscopic ellipsometers are used for optoelectronic thin film structures analysis such as LED. Film thickness, optical constants and alloy composition are the properties of interest. HORIBA Scientific’s patented sample vision system provides the advantage to visualize and position the measurement spot inside a LED pixel. Read More

Application Notes

  • SE-27:Characterisation of LED Thin Film Devices by Spectroscopic Ellipsometry
  • SE-05:Porous Silicon Composite Material
  • SE-24:VO2 Smart Materials

PT. HORIBA Indonesia

Ruko Jalur Sutera Jl. Jalur Sutera Blok 20 A No. 16-17 Tangerang, Banten 15144, Indonesia

Tel: +62 (21) 30448525
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