For non-destructive thin film characterization in material research, ellipsometers enable users to characterize thin film thickness, optical constants and many other material properties of nano and micro layers. Read More

Application Notes

  • SE-09:Characterization of Aluminum Anodized Surfaces using the MM-16 Spectroscopic Ellipsometer
  • SE-11:Standard applications by Spectroscopic Ellipsometry
  • SE-14:Characterization of barrier layers by Spectroscopic Ellipsometry for packaging applications
  • SE-19:Characterization of GeSbTe films by Spectroscopic Ellipsometry for Rewritable Optical Discs
  • SE-29:Ellipsometric characterization of doped and undoped crystalline diamond structures
  • SE-32:Characterization of SiO2 on glass by Spectroscopic Ellipsometry

For a list of all available application notes please click here.

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