Spectroscopic ellipsometers are widely used in flat panel display industries and in R&D of flexible displays. Ellipsometers enable users to characterize thin film thickness, optical constants, material uniformity and morphology on a large spectral range from FUV to NIR. Read More.

Application Notes

  • SE-27:Characterisation of LED Thin Film Devices by Spectroscopic Ellipsometry
  • SE-03:TFT - LCD Display
  • SE-22:Characterization of thicknesses and optical constants of encapsulated OLED devices - Investigation of the aging process of an OLED
  • SE-02:PDP - Plasma Display Panel
  • SE-01:OLED - Organic Light Emitting Diodes
  • SE-15:Characterization of TFT and LTPS TFT-LCD Display Panels

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